发明名称 DEVICE AND METHOD FOR PREPARING SAMPLE FOR THERMAL ANALYSIS
摘要 PROBLEM TO BE SOLVED: To provide a device and method for preparing a sample for thermal analysis for filling a sample that is used by a thermal analysis device for measuring the thermal characteristics or the like of a material into a sample container appropriately and rapidly without scattering or the like. SOLUTION: A device 1 for preparing a sample for thermal analysis introduces a sample S into a sample container 8 being detachably fixed to a container installation recessed part 7a of a sample container stand 7 of a pedestal 2 by a sample introduction part 9 being detachably loaded into the sample container 8, presses the sample S being introduced into the sample container 8 with a press rod 5 for filling into the bottom part of the sample container 8, and at the same time rotates and moves the press rod 5 in a fixed direction for pressing the sample S when traveling in the direction of the sample S, and rotates and moves the press rod 5 in the same direction when traveling in the direction of the sample S when traveling in a direction away from the sample S, thus appropriately and rapidly filling the sufficient amount of sample S at the bottom of the sample container 8 without scattering the sample S that is in fiber shape and light and may be scattered.
申请公布号 JP2001033365(A) 申请公布日期 2001.02.09
申请号 JP19990210176 申请日期 1999.07.26
申请人 RICOH CO LTD 发明人 MOCHIZUKI YUMI
分类号 G01N25/20;G01N1/36;(IPC1-7):G01N1/36 主分类号 G01N25/20
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