发明名称 OPTICAL SUB-PIXEL PARTS INSPECTION SYSTEM
摘要 An inspection system (10) for evaluating workpieces for conformance to configuration criteria including a track (16) for causing workpieces (22) to translate through a test section (18), the test section (18) including a lig ht source (40) for production of a uniform sheet of light (44), the light sourc e (40) oriented with respect to the track (16) such that the workpieces (22) occlude the uniform sheet of light (44) upon passing through the test sectio n (18), the test section (18) further having a video system (40, 42) for receiving the occluded uniform sheet of light (44), providing output signals related to the intensity of the occluded uniform sheet of light (44) inciden t on the video system (40, 42), and a signal processing means (64) for receivi ng the output signals.
申请公布号 CA2380917(A1) 申请公布日期 2001.02.08
申请号 CA20002380917 申请日期 2000.08.01
申请人 MECTRON ENGINEERING COMPANY 发明人 HANNA, JAMES L.
分类号 G01B11/24;G01B11/245;G01N21/952;(IPC1-7):G01B11/04 主分类号 G01B11/24
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