发明名称 PROCESS FOR FORMING STRUCTURE WITH DIFFERENT DOPED REGIONS, SHOWING A HYPERFINE TRANSITION REGION, FOR FORMING POROUS SILICON
摘要 A process for forming structures with different conductivity showing a hyperfine transition region, for forming porous silicon for semiconductor integrated circuits, in particular provides the forming of PHI /N<+(+)>/N<(-)>-type structures for the subsequent selective anodization of one or more regions of N<+(+)> semiconducting material for forming porous silicon, so as to comprise the steps of: forming one or more regions of N<+(+)> semiconducting material inside a N<(-)> semiconducting material substrate; and growing a PHI semiconducting material epitaxial layer at a temperature lower than 900 DEG C.
申请公布号 WO0109942(A1) 申请公布日期 2001.02.08
申请号 WO2000IT00329 申请日期 2000.08.02
申请人 SHINE S.P.A.;BALUCANI, MARCO;BONDARENKO, VITALY;DOLGYI, LEONID;FERRARI, ALDO;LAMEDICA, GIULIO;YAKOVTSEVA, VALENTINA 发明人 BALUCANI, MARCO;BONDARENKO, VITALY;DOLGYI, LEONID;FERRARI, ALDO;LAMEDICA, GIULIO;YAKOVTSEVA, VALENTINA
分类号 H01L21/205;H01L21/22;H01L21/306;H01L21/762;(IPC1-7):H01L21/762 主分类号 H01L21/205
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