发明名称 |
GROUP III NITRIDE SEMICONDUCTOR DEVICE AND ITS PRODUCTION |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for producing a semiconductor device having a high-quality group III nitride epitaxial layer with slight defects. SOLUTION: A group III element, e.g. gallium is melted and the surface of the gallium melt 2 is then nitrided to form a nitride thin film. A group III nitride is further epitaxially grown thereon to form a substrate. An epitaxial layer 5 comprising Ga1-x-yInxAlyN (x and y are each a number within the range of 0<=x<=1 and 0<=y<=1). A semiconductor element is provided in the resultant epitaxial layer 5.
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申请公布号 |
JP2001031499(A) |
申请公布日期 |
2001.02.06 |
申请号 |
JP19990204084 |
申请日期 |
1999.07.19 |
申请人 |
HITACHI LTD |
发明人 |
MISHIMA TOMOYOSHI;KUDO MAKOTO;OUCHI KIYOSHI |
分类号 |
H01L29/78;C30B25/02;C30B29/38;H01L21/205;H01L21/338;H01L29/812;H01S5/323;H01S5/343;(IPC1-7):C30B29/38 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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