发明名称 GROUP III NITRIDE SEMICONDUCTOR DEVICE AND ITS PRODUCTION
摘要 PROBLEM TO BE SOLVED: To provide a method for producing a semiconductor device having a high-quality group III nitride epitaxial layer with slight defects. SOLUTION: A group III element, e.g. gallium is melted and the surface of the gallium melt 2 is then nitrided to form a nitride thin film. A group III nitride is further epitaxially grown thereon to form a substrate. An epitaxial layer 5 comprising Ga1-x-yInxAlyN (x and y are each a number within the range of 0<=x<=1 and 0<=y<=1). A semiconductor element is provided in the resultant epitaxial layer 5.
申请公布号 JP2001031499(A) 申请公布日期 2001.02.06
申请号 JP19990204084 申请日期 1999.07.19
申请人 HITACHI LTD 发明人 MISHIMA TOMOYOSHI;KUDO MAKOTO;OUCHI KIYOSHI
分类号 H01L29/78;C30B25/02;C30B29/38;H01L21/205;H01L21/338;H01L29/812;H01S5/323;H01S5/343;(IPC1-7):C30B29/38 主分类号 H01L29/78
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