发明名称 Thermal protection system for a chemical vapor deposition machine
摘要 A thermal protection system for a chemical vapor deposition machine (CVD). The system of the present invention includes a thermal sensor for providing a temperature signal corresponding to a CVD chamber temperature, a heating component for heating the CVD chamber, and a controller for regulating the CVD chamber temperature. The controller is coupled to receive the temperature signal and to control the heating component in response thereto. An interlock circuit is coupled between the heating component and the controller. The interlock circuit has an open state and a closed state. A comparison circuit is coupled to receive the temperature signal and coupled to control the interlock circuit, wherein the comparison circuit effects a comparison between the temperature signal and a reference and commands the interlock to the open state when the temperature signal exceeds the reference. In so doing, the comparison circuit protects the CVD chamber from an over-temperature condition that might not otherwise be prevented by the controller.
申请公布号 US6183562(B1) 申请公布日期 2001.02.06
申请号 US19970996961 申请日期 1997.12.23
申请人 SONY CORPORATION OF JAPAN;SONY ELECTRONICS, INC. 发明人 PIERCE TRACY LAVALLE;CZAJA DOUGLAS A.
分类号 C23C16/46;C23C16/52;(IPC1-7):C23C16/52 主分类号 C23C16/46
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