发明名称 Non-volatile memory cell with non-trenched substrate
摘要 In a non-volatile memory cell that has a select transistor and a memory transistor, the substrate trenching that occurs when the gate of the select transistor and the stacked gate of the memory transistor are initially defined is eliminated by forming the gate of the select transistor and the stacked gate of the memory transistor to have substantially the same step height.
申请公布号 US6184552(B1) 申请公布日期 2001.02.06
申请号 US19980118574 申请日期 1998.07.17
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 KALNITSKY ALEXANDER;BERGEMONT ALBERT
分类号 H01L21/8247;(IPC1-7):H01L29/788 主分类号 H01L21/8247
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