发明名称 Design verification for asymmetric phase shift mask layouts
摘要 A checking routine verifies a phase shifted mask (PSM) design based on fundamental principles of PSM and utilizing only basic shape manipulation functions and Boolean operations found in most computer aided design (CAD) systems. The design verification system checks complete chip designs for the two possible design errors that can cause defective masks by eliminating the phase transition; namely, placing a 180° phase region on both sides of a critical feature or completely omitting the phase region adjacent to certain critical features.
申请公布号 US6185727(B1) 申请公布日期 2001.02.06
申请号 US19950570851 申请日期 1995.12.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LIEBMANN LARS WOLFGANG
分类号 G03F1/00;(IPC1-7):G06F17/50 主分类号 G03F1/00
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