发明名称 METHOD FOR OPENING PAD OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for opening a pad of a semiconductor device is provided to prevent a charge-up phenomenon in a pad opening process by stabilizing electrification of gas in an etch process and an ashing process. CONSTITUTION: The first tungsten titanium layer(22), an aluminium layer(23), and the second tungsten titanium layer are laminated on a predetermined region of a semiconductor substrate(21). An oxide layer(25) and a silicon nitride layer(26) are deposited on a whole surface of the semiconductor substrate(21). A photoresist layer(27) is formed on the silicon nitride layer(26). The photoresist layer(27) is patterned selectively. The silicon nitride layer(26) is etched by using an etch gas. The oxide layer(25) is etched by using the patterned photoresist layer(27) as a mask. The second tungsten titanium layer(24) is etched by performing an over-etch process. The photoresist layer(27) is removed by performing an ashing process.
申请公布号 KR100287880(B1) 申请公布日期 2001.02.01
申请号 KR19980019273 申请日期 1998.05.27
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 SHIN, HUI CHEOL
分类号 H01L21/02;(IPC1-7):H01L21/02 主分类号 H01L21/02
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