发明名称 |
Large Scale Integration test device has I/O connections corresponding to the number of connecting pins on the LSI and a control circuits corresponding to the I/O connections |
摘要 |
The LSI test device has a number of I/O connections corresp. to the number of connecting pins on the LSI and a number of control circuits corresp. to the I/O connections. Each control circuit has a waveform and time signal generating circuit for generating an output signal when receiving a reference signal, a time offset circuit for setting the time characteristics of the output signal, a feedback path and a state detection unit. An Independent claim is also included for a calibration method for use with an LSI test arrangement.
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申请公布号 |
DE10002370(A1) |
申请公布日期 |
2001.02.01 |
申请号 |
DE20001002370 |
申请日期 |
2000.01.20 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO |
发明人 |
SUGIMOTO, MASARU;NAKASE, YASUHIDE;NISHIMURA, TOMOHIRO;FUNAKURA, TERUHIKO |
分类号 |
G01R31/28;G01R31/319;G01R35/00;(IPC1-7):G01R31/318 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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