发明名称 INFRARED THERMOGRAPHIC METHOD FOR PROCESS MONITORING AND CONTROL OF MULTILAYER CONDUCTIVE COMPOSITIONS
摘要 An infrared thermographic camera is used to detect non-uniformities in the surface temperature of a multi-layer conductive composition comprising at least two electronically conductive layers (11, 14) separated by an electronically insulating layer (13). The temperature non-uniformities are caused by ohmic heating brought about by a flow of electrical current through a defect (16) or defects in the electronically insulating layer (13) when a predetermined voltage is applied to the two electronically conductive layers (11, 14). The two electronically conductive layers may comprise the positive (11) and negative electrode (14) pair of an electrochemical device, such as a primary or rechargeable battery, supercapacitor, or electrochromic element, and the electronically insulating layer (13), which is superimposed between the two layers (11, 14), may constitute the separator or electrolyte layer of the electrochemical device. One or more layers of the device may additionally comprise electronically insulating liquid components, which may be ionically conductive. The device may be tested "as is", or it may be tested inside a thin, impermeable package. The method is particularly useful for process optimization and control during the fabrication of multi-layer bonded plastic batteries.
申请公布号 WO0107901(A1) 申请公布日期 2001.02.01
申请号 WO2000US15635 申请日期 2000.06.07
申请人 TELCORDIA TECHNOLOGIES, INC. 发明人 GOZDZ, ANTONI, S.
分类号 G01N25/72;G01R31/02;G01R31/36;(IPC1-7):G01N25/72 主分类号 G01N25/72
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