Test head for microstructures with interface

摘要

The test head has several contact elements (25) which electrically connect with a connector element (11) of a test apparatus. The contact elements are arranged in a guide so as to axially movable in an associated opening in the guide. One end of each contact element is directed to a contact point of the connector element. The other end can be directed to a respective test point of the test piece. The contact elements are secured on the openings so that they do not fall out. The connector element and the contact device are releasably connected together by fastening means (9).