发明名称 |
CHEMICAL AMPLIFICATION TYPE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To improve dry etching resistance and to reduce chapping of a resist surface after dry etching by incorporating multifunctional epoxy compound and/or multifunctional vinyl ether compound into a composition. SOLUTION: A chemical amplification type resist composition contains a resin which becomes dissolvable in an alkali aqueous solution by an acid and an optical acid generating agent and further contains the multifunctional epoxy compound and/or multifunctional vinyl ether compound. The multifunctional epoxy compound and the multifunctional vinyl ether compound are compounds respectively having two or more epoxy groups or vinyl ether groups in a molecule and are used as a crosslinking agent. The resin which becomes dissolvable in the alkali aqueous solution by the acid includes a monomer unit having an alicyclic skeleton and a monomer unit having a lactone skeleton. The monomer unit having the alicyclic skeleton is selected from cyclohexyl (meth)acrylate or the like and the monomer unit having the lactone skeleton is selected from (meth)acrylate having a δ-valerolactone ring or the like. |
申请公布号 |
JP2001027806(A) |
申请公布日期 |
2001.01.30 |
申请号 |
JP19990199097 |
申请日期 |
1999.07.13 |
申请人 |
MITSUBISHI RAYON CO LTD |
发明人 |
FUJIWARA TADAYUKI;WAKIZAKA YUKIYA |
分类号 |
H01L21/027;G03F7/032;G03F7/039;G03F7/40 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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