发明名称 SCANNING PROBE MIROSCOPE AND MEASURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To enable reliable measurement high in S/N in a scanning probe microscope measuring the surface state or surface vol. distribution of a sample. SOLUTION: A shield plate 1 covering a sample 25 and having an opening 11 exposing the contact region with a probe needle 2a of the sample is provided between a conductive cantilever 2 having the probe needle 2a coming into contact with the surface of the sample provided to one end thereof and the sample 25 and the vol. generated between the sample 25 and the cantilever 2 or the opening 11 is made as possible as small to eliminate a parasitic vol.
申请公布号 JP2001027644(A) 申请公布日期 2001.01.30
申请号 JP19990200152 申请日期 1999.07.14
申请人 NEC CORP 发明人 KODAMA NORIYUKI
分类号 G01B21/30;G01N37/00;G01Q20/02;G01Q30/08;G01Q30/18;G01Q30/20;G01Q60/24;G01Q60/46;(IPC1-7):G01N37/00 主分类号 G01B21/30
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