发明名称 Method and system for testing an integrated circuit input capacitance, particularly for a contactless operating integrated circuit
摘要 A method for testing an integrated circuit comprising an input capacitance designed to form, with an antenna coil, a resonant receiver circuit with a predetermined natural frequency. The input capacitance is connected to a test inductance chosen to form, with the input capacitance, a resonant test circuit having a resonant frequency substantially equal to the natural frequency of the resonant receiver circuit. The resonant test circuit is excited by an alternating signal provided through a transformer. The testing of inductive integrated circuits working without contact is implemented in a corresponding test system.
申请公布号 US6181152(B1) 申请公布日期 2001.01.30
申请号 US19980193768 申请日期 1998.11.17
申请人 STMICROELECTRONICS S.A. 发明人 ENGUENT JEAN-PIERRE
分类号 G01R31/28;G01R31/315;(IPC1-7):G01R31/26;G01R27/28 主分类号 G01R31/28
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