发明名称 METHOD OF PROCESSING WAFERS
摘要 PROBLEM TO BE SOLVED: To provide a method of processing wafers where the rotation of wafers of various sizes and have orientation flats, can be controlled simply. SOLUTION: This method comprises the steps of attaching a wafer adaptor 10 to a semiconductor wafer 1, the adapter 10 being engageable with the periphery of a semiconductor wafer 1 to make the outer edge circular, and lowering the wafer 1 vertically to at least two, upper and lower, sloped guide rails 2 and 3 while rotating the wafer 1, the rails 2 and 3 which are engaged rotatably with the outer circumferential circle of the adaptor 10, whereby a processing operation is performed onto at least one of the surfaces of the wafer 1 which is lowered sideways, while rolling.
申请公布号 JP2001028387(A) 申请公布日期 2001.01.30
申请号 JP19990200142 申请日期 1999.07.14
申请人 TOPPAN PRINTING CO LTD 发明人 FUJITA KEI
分类号 H01L21/677;H01L21/306;H01L21/673;H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/677
代理机构 代理人
主权项
地址