发明名称 Nonvolatile integrated circuit memory devices having improved word line driving capability and methods of operating same
摘要 Nonvolatile integrated circuit memory devices include a memory cell array having a plurality of rows of memory cells therein that are electrically coupled to respective word lines. A word line driver circuit is provided having a plurality of outputs electrically coupled to the word lines. A preferred voltage supply control circuit is also provided. This voltage supply control circuit is responsive to a verify enable signal and a flag signal and powers the word line driver circuit at a first voltage level when the verify enable signal is inactive or the flag signal is active, and powers the word line driver circuit at a second voltage level greater than the first voltage level when the verify enable signal is active and the flag signal is inactive. The first voltage level corresponds to a power supply voltage level Vcc and the second voltage level corresponds to a boosted voltage level Vpp having a magnitude that exceeds a magnitude of the power supply voltage level Vcc. The memory device also comprises a program/erase verification control circuit that generates an active verify enable signal continuously during a verification time interval and generates an active flag signal as a series of pulses during the verification time interval. Because the generation of an active flag signal results in the generation of a word line voltage having reduced magnitude, smaller pull-down transistors can be used within the word line driver circuit and higher integration densities can therefore be achieved.
申请公布号 US6181606(B1) 申请公布日期 2001.01.30
申请号 US19990428816 申请日期 1999.10.28
申请人 SAMSUNG ELECTRONICS CO., INC. 发明人 CHOI KI-HWAN;PARK JONG-MIN
分类号 G11C16/06;G11C16/04;G11C16/08;G11C16/12;(IPC1-7):G11C16/06 主分类号 G11C16/06
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