Scan flip-flop that simultaneously holds logic values from a serial load and a subsequent parallel load

摘要

The scan flip-flop that controls a bi-directional or a switchable high-impedance driver is implemented so that, when a logic value on a first input is latched in response to a first clock signal, and a logic value on a second input is latched in response to a second clock signal, both logic values are output during the second clock period.