发明名称 Very low thermal budget channel implant process for semiconductors
摘要 An ultra-low thermal budget process is provided for channel implant by using a reverse process sequence where a conventional MOS transistor is formed without the channel implant. The originally deposited polysilicon gate is removed, a nitride film deposition and etch is used to form a nitride spacer with a predetermined configuration, and a self-aligned channel implant is performed. After the channel implantation, anneal and super-retrograded doping, the nitride spacer and the gate oxide are removed for subsequent regrowth of a second gate oxide and a polysilicon deposition to form a second polysilicon gate.
申请公布号 US6180468(B1) 申请公布日期 2001.01.30
申请号 US19980177774 申请日期 1998.10.23
申请人 ADVANCED MICRO DEVICES INC. 发明人 YU BIN;ISHIDA EMI;LUNING SCOTT;THURGATE TIMOTHY
分类号 H01L21/336;H01L29/10;(IPC1-7):H01L21/336;H01L21/320 主分类号 H01L21/336
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