发明名称 Apparatus and method for controlling plasma uniformity across a substrate
摘要 A novel hollow cathode magnetron source is disclosed. The source comprises a hollow cathode with a non-planar target. By using a magnet between the cathode and a substrate, plasma can be controlled to achieve high ionization levels, good step coverage, and good process uniformity.
申请公布号 US6179973(B1) 申请公布日期 2001.01.30
申请号 US19990345466 申请日期 1999.06.30
申请人 NOVELLUS SYSTEMS, INC. 发明人 LAI KWOK F.;NORDQUIST ANDREW L.;ASHTIANI KAIHAN A.;HARTSOUGH LARRY D.;LEVY KARL B.
分类号 H01J37/34;(IPC1-7):C23C14/34;C23C14/35 主分类号 H01J37/34
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