发明名称 REGULAR REFLECTION TYPE DISPLACEMENT GAUGE
摘要 PROBLEM TO BE SOLVED: To perform high-speed measurement on objects other than transparent objects and high-accuracy measurement on the transparent objects by using one displacement gauge by scanning a liquid crystal shutter arranged on this side of a photodetector. SOLUTION: A liquid crystal shutter 1 is arranged on this side of the light receiving surface of a photodetector (PSD) 51. A state where only the reflected light from the surface S to be measured of an object 52 to be measured is interrupted and another state where only the reflected light from the rear surface N of a transparent object is interrupted are produced by scanning the light shielding portion 1a of the shutter 1 along the light receiving surface of the PSD 51. When only the reflected light from the surface S to be measured is received by means of the PSD 51 by only interrupting the reflected light from the rear surface N, the displacement of the surface S can be detected accurately by reducing measurement errors even when the object 52 is transparent. In addition, the thickness of the object 52 can be detected based on the difference between the light receiving centers in the state where only the reflected light from the surface S is interrupted and the state where only the reflected light from the rear surface N is interrupted on the PSD 51.
申请公布号 JP2001021313(A) 申请公布日期 2001.01.26
申请号 JP19990192804 申请日期 1999.07.07
申请人 MITSUTOYO CORP 发明人 NISHIMURA TAKESHI;FURUSHIMA HIROMITSU;KOMEHANA TAKASHI
分类号 G01B11/00;G01C3/06;(IPC1-7):G01B11/00 主分类号 G01B11/00
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