发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY
摘要 <p>PROBLEM TO BE SOLVED: To increase the number of memory cells per cell string without affecting the path voltage stress by connecting a first string segment to a corresponding bit line, connecting the first string segment to a second string segment, and connecting the second string segment to a common source line by first, second, and third selecting signal respectively. SOLUTION: A memory block BLK includes plural strings corresponding to bit lines BL0-BLj. Each string includes a string selecting transistor SST, an intermediation transistor ILT, and ground selecting transistor GST. The string selecting transistor SST, memory cells MTo-MT15, and the intermediation transistor ILT constitute a first string segment, and the intermediation transistor ILT, memory cell MB0-MB15, and the ground selecting transistor GST constitute a second string segment.</p>
申请公布号 JP2001023386(A) 申请公布日期 2001.01.26
申请号 JP20000188002 申请日期 2000.06.22
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KWON SUK-CHUN
分类号 G11C16/04;G11C16/02;G11C16/24;(IPC1-7):G11C16/04 主分类号 G11C16/04
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