| 摘要 |
PURPOSE: To provide a semiconductor device capable of suppressing the occupied area of a test circuit from increasing and simultaneously testing operations tests of plural memory circuits. CONSTITUTION: A test section 18 outputs a control signal CNTL to two memory circuits 21, 23, and each memory circuit 21, 23 outputs read-out data RDAT-1, RDAT-2 to comparison discriminating circuits 22, 24 responding to it. The comparison discriminating circuits 22, 24 compare expected value data TP supplied from the test section 18 with the read-out data RDAT-1, RDAT-2, and outputs discrimination signals JUDG1, JUDG2. Expected value data received by the comparison discriminating circuits 22, 24 is delayed by the same delay as the control signal CNTL received by each memory circuit 21, 23. Therefore, timing with which expected value data TP is received coincides almost with timing with which the read-out data RDAT-1 and RDAT-2 is received. |
