| 摘要 |
PROBLEM TO BE SOLVED: To make smoothly and quickly testable and measurable the electric characteristics of each IC device loaded on each test board by turning two test boards into a vertical state, and simultaneously connecting/disconnecting them with/from a test head with a small-scaled and compact constitution. SOLUTION: In a loader part 10 and an unloader part 14, test boards 1 are turned into a horizontal state so that devices can be transferred, and while the test boards 1 are carried to a pre-heat part 11, the attitude is changed so that the test boards 1 can be turned into a vertical state, and the vertical state is held unit the test boards 1 are transmitted through a testing and measuring part 12 to a defroster part 13, and the horizontal state is restored while the test boards 1 are transferred from tae defroster part 13 to the unloader part 14. The loader part 10 and the unloader part 14 are positioned within almost the same horizontal face H, and the pre-heat part 11 is arranged at the upper part of the horizontal face H, and the defroster part 13 is arranged at the lower part of the horizontal face H, and the two test boards 1 are arranged at the upper and lower parts of the horizontal face H in a holder frame constituting a board positioning unit in a connecting/disconnecting means in the testing and measuring part 12.
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