发明名称 Semiconductor device with resistor and fabrication method therof
摘要 A semiconductor device capable of the area reduction of a resistor. A semiconductor substrate having a first conductive region is prepared. A dielectric layer is formed to cover the first conductive region. The dielectric layer has a contact hole formed to vertically penetrate the dielectric layer. The first conductive region is exposed from the dielectric layer in the contact hole. A semiconductor plug is formed to fill the contact hole with a material of the plug. The plug is doped with an impurity. The bottom of the plug is contacted with the first conductive region. A second conductive region is selectively formed to cover the semiconductor plug. The second conductive region is contacted with the top of the semiconductor plug. The semiconductor plug has a resistance. The semiconductor plug and the second conductive region has a contact resistance. The semiconductor plug and the second conductive region serve as a resistor having a resistance equal to the sum of the resistance of the semiconductor plug and the contact resistance. Preferably, the resistance of the second conductive region is equal to or less than ({fraction (1/10)}) of the contact resistance of the semiconductor plug and the second conductive layer.
申请公布号 US6177701(B1) 申请公布日期 2001.01.23
申请号 US19970774720 申请日期 1997.01.03
申请人 NEC CORPORATION 发明人 MATSUMOTO NAOYA
分类号 H01L21/28;H01L21/02;H01L21/82;H01L21/822;H01L23/522;H01L27/04;H01L27/06;H01L27/118;(IPC1-7):H01L27/108 主分类号 H01L21/28
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