发明名称 Method of silicide film formation onto a semiconductor substrate
摘要 A method of depositing metal silicide onto a semiconductor substrate includes a step of depositing, by a CVD process, a first metal silicide layer with silane gas onto the semiconductor substrate. The method also includes a step of thermally treating and chemically cleaning the semiconductor substrate. The method further includes a step of depositing, by the CVD process, a second metal silicide layer with silane gas onto the semiconductor substrate. By this method, cracks in the metal silicide formed on the semiconductor substrate are minimized.
申请公布号 US6177345(B1) 申请公布日期 2001.01.23
申请号 US19980080405 申请日期 1998.05.18
申请人 ADVANCED MICRO DEVICES, INC. 发明人 MORALES GUARIONEX;WANG JIANSHI;RIZZUTO JUDITH Q.;FANG HAO
分类号 H01L21/285;H01L21/3205;(IPC1-7):H01L21/44 主分类号 H01L21/285
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