发明名称 METHOD AND APPARATUS FOR OBSERVING SAMPLE IMAGE IN SCANNING TYPE CHARGED PARTICLE BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To automatically, accurately return to the original observing position after moving a sample or image. SOLUTION: In this apparatus, when observing an image on the original position after having observed a sample or image by rotating or moving it, an operating means 26 instructs to return the image. According to this instruction, a CPU control circuit 18 reads out stored history data on the rotation and movement of the sample or image from a memory 27. For example, when a sample 2 has been rotated mechanically, according to the data from the memory 27 on the rotated amount or rotated direction, the CPU control circuit 18 controls an R-movement drive circuit 23 to rotate a stage 21 by a predetermined amount in the rotational direction inverse to the previous rotation. Consequently, the sample can return to the state before rotated.
申请公布号 JP2001015058(A) 申请公布日期 2001.01.19
申请号 JP20000116293 申请日期 2000.04.18
申请人 JEOL LTD 发明人 YAMADA ATSUSHI;SAITO MASAKI
分类号 H01J37/20;H01J37/22;H01J37/28;(IPC1-7):H01J37/22 主分类号 H01J37/20
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