发明名称 SUPERJUNCTION SEMICONDUCTOR ELEMENT AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To elevate breakdown strength, in a superjunction semiconductor element which is equipped with a drift layer, consisting of parallel pn layers letting current flow in on conditions and also being depleted in off conditions. SOLUTION: This superjunction semiconductor element is provided with an n high-resistance region 20, around a drift layer 12 consisting of parallel pn layers composed of n drift regions 12a and p partition regions 12b, and concentration ND of the impurities in the high-resistance region 20 is set at 5.62×1017×VDSS-1.36 (cm-3) or lower. But, VDSS shows breakdown strength (V). Furthermore, an n-channel stopper region adjacent to the high-resistance region 20 is arranged.
申请公布号 JP2001015752(A) 申请公布日期 2001.01.19
申请号 JP19990308523 申请日期 1999.10.29
申请人 FUJI ELECTRIC CO LTD 发明人 SHINDO YOICHI;MIYASAKA YASUSHI;FUJIHIRA TATSUHIKO;TAKEI MANABU
分类号 H01L29/861;H01L29/06;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/861
代理机构 代理人
主权项
地址