发明名称 |
RESIN SEALED ELECTRONIC DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To improve the life of a resin sealed electronic device by coating the surface of a semiconductor power element opposite to a surface facing a heat sink with polyimide material, exposing a metallic heat sink base in the rear of a heat sink, and setting linear expansion coefficient of resin in a specified range. SOLUTION: In a power element 1, thermal stress from a mold material 7 is relaxed by using a power element wherein polyimide coating is applied to a part which becomes a contact surface with mold resin 7 during element manufacturing. A plating-free part is provided to a rear of a metallic heat sink 3 for improving adhesion with the mold resin 7 and thermal stress from the mold resin 7 is absorbed by the metallic heat sink 3. Furthermore, the mold resin 7 restrains thermal stress low by using mold resin whose linear expansion coefficient is between linear expansion coefficient of 3×10-6/ deg.C of the power element 1 and linear expansion coefficient of 17×10-6/ deg.C of copper in the metallic heat sink 3. Therefore, heat resistance cycle property can be improved. |
申请公布号 |
JP2001015682(A) |
申请公布日期 |
2001.01.19 |
申请号 |
JP19990181071 |
申请日期 |
1999.06.28 |
申请人 |
HITACHI LTD;HITACHI CAR ENG CO LTD |
发明人 |
HIRAKAWA SATOSHI;KAMINAGA TOSHIAKI;KOBAYASHI RYOICHI;SUGIURA NOBORU |
分类号 |
H01L23/373;F02P3/02;F02P15/00;H01L23/31;H01L23/433;H01L25/07;H01L25/18;H05K3/28;H05K5/06 |
主分类号 |
H01L23/373 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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