| 摘要 |
PROBLEM TO BE SOLVED: To shorten recovery time by searching a fault spot again while arbitrarily and variably selecting fault standardization after erroneous diagnosis for specifying the fault spot on the basis of intra-device self-diagnosis by arbitrarily selecting a fault standardizing method for the fault spot. SOLUTION: In the case of fault standardization based on intra-device self- diagnosis, each part in a device is blocked (packaged: PKG) into exchangeable unit and the propriety of PKG is independently judged by performing self- monitor for the unit of PKG. In such fault standardization, the fault standardizing method for the fault spot can be arbitrarily and variably selected. For example, a serial system model is composed of a monitor signal inserting part (INS) (transmission side) 1 between PKG A and PKG B, a monitor signal detecting part (DET) (reception side) 2 between PKG A and PKG B, a monitor signal inserting part (INS) (transmission side) 5 between PKG B and PKG C, and monitor signal detecting part (DET) (reception side) 6 between PKG B and PKG C. |
