发明名称 ELECTROMAGNETIC WAVE DISTURBANCE SOURCE SURVEYING METHOD AND DEVICE THEREOF
摘要 PROBLEM TO BE SOLVED: To eliminate influence of external electromagnetic waves by performing electromagnetic wave measurement aimed at an object to be measured and that aimed at external electromagnetic waves alone and computing a differential between the respective measurement data. SOLUTION: A probe driving device 11 moves an antenna probe 12 relatively to an object 18 to be measured for scanning it. In a storage device 16, data of frequency- to-electromagnetic wave intensity obtained by one scanning pass in a measurement set area over the object 18 to be measured is stored as a measurement data D1 for one scanning pass. In this process current supply to a printed circuit board assumed in the object 18 to be measured is stopped and measurement is carried out again for storing a measurement data D2 of a second scanning pass in the storage device 16. The first scanning data D1 and the second scanning data D2 are different from each other in a measurement time and power source supply to the object 18 to be measured. Consequently, when the measurement data D1, D2 stored in the storage device 16 are fed to a computing device 17, in which a differential between the measurement data D1, D2 is computed, only an external electromagnetic wave constituent is canceled from the both measurement data.
申请公布号 JP2001013183(A) 申请公布日期 2001.01.19
申请号 JP19990185853 申请日期 1999.06.30
申请人 TOSHIBA CORP 发明人 HORIGUCHI YOSHINORI;IWAHARA HIROKI
分类号 G01R29/08;(IPC1-7):G01R29/08 主分类号 G01R29/08
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