发明名称 DISPLAY UNEVENNESS INSPECTION DEVICE AND DISPLAY UNEVENNESS INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To make it possible to recognize display unevenness (color irregularity, etc.), as quantitative characteristics by using a color image pickup means and efficiently detecting the display unevenness by the same. SOLUTION: This display unevenness inspection method captures the image of a liquid crystal cell substrate 7 by the color image pickup means (a color CCD area sensor 1, a lens 2, etc.), and comparing the RGB(red, green and blue) values of the respective pixels in this image. Namely, the intensity of these RGB values, the variations in the RGB values at respective coordinates, the variations in the RGB values among the coordinates, the space frequency state of a color distribution, etc., are detected in accordance with the RGB values of the respective pixels in the image and the display unevenness (color irregularity, etc.), which is heretofore detected by qualitative function inspection is recognized as the quantitative characteristics, by which the display unevenness is efficiently detected with the good accuracy.
申请公布号 JP2001013476(A) 申请公布日期 2001.01.19
申请号 JP19990186462 申请日期 1999.06.30
申请人 RICOH CO LTD 发明人 KAMIJO TADAHIRO
分类号 G09F9/00;G02F1/13;G02F1/1335 主分类号 G09F9/00
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