发明名称 |
SEMICONDUCTOR PROTECTING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To obtain a semiconductor protecting device which uses poly- crystalline silicon as an active region so as to suppress a current flowing into a main semiconductor switch below a set value. SOLUTION: An IGBT 11, which uses a signal-crystal silicon substrate as an active region has a gate electrode connected to a control signal source PG via a gate driver 13. The IGBT 11 has a sense terminal 11s for making a branched sense current flow. To a node between the gate driver 13 and the gate electrode of the IGBT 11, a shunting N-MOSFET 15 is connected in order to protect the IGBT 11 against an overcurrent. The gate of the MOSFET 15 is connected to the sense terminal 11s via a voltage detector 21 arranged in a sense circuit 20. The MOSFET 15 and voltage detector 21 use a polycrystalline silicon semiconductor layer as an active region. |
申请公布号 |
JP2001016082(A) |
申请公布日期 |
2001.01.19 |
申请号 |
JP19990185860 |
申请日期 |
1999.06.30 |
申请人 |
TOSHIBA CORP |
发明人 |
MATSUSHIRO TOMOKO;KOJIMA TSUTOMU;NAKAGAWA AKIO |
分类号 |
H01L27/04;H01L21/822;H03K17/08;H03K17/56 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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