SEMICONDUCTOR MEMORY CHIP

摘要

PROBLEM TO BE SOLVED: To enable testing at higher speed and more efficiently by providing a first memory array to be tested and a pattern generator formed on a memory chip, and providing a programmable memory array and a means specifying an address of pattern data stored in the programmable memory array in the pattern generator. SOLUTION: A semiconductor memory chip 100 has a memory array 102 consisting of plural memory banks 104 including a memory cell 106. A pattern generator 108 supplies a test pattern for testing the memory cell 106. A memory 14 of the pattern generator 108 can be directly accessed by data input and program-in. Pattern data is stored in the memory 114 by data input. Writing data in the memory 114 from the program and operation of overwriting can be programmed. The prescribed pattern is inputted to the pattern generator 108 by a pattern address line and programming can be performed.