发明名称 SLURRY, CMP METHOD AND PRODUCTION OF SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To form a Damascene interconnection with small dishing. SOLUTION: A Damascene interconnection is formed by removing excess metallic film and liner film on the outside of an interconnection trench by CMP method using slurry containing a polishing agent produced by cementing a plurality of active particles (silica) 1 through an inactive body (PMMA) 12.</p>
申请公布号 JP2001015462(A) 申请公布日期 2001.01.19
申请号 JP19990187027 申请日期 1999.06.30
申请人 TOSHIBA CORP;JSR CORP 发明人 MINAMIZOE MANABU;MATSUI YUKITERU;FUKUSHIMA MASARU;YANO HIROYUKI;IIO AKIRA;HATTORI MASAYUKI;MOTONARI MASAYUKI
分类号 B24B37/00;H01L21/304;(IPC1-7):H01L21/304 主分类号 B24B37/00
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