Arrangement for simultaneous force microscopy during optical near field microscopy has coupling element consisting at least partly of set material and can additionally contain bearer parts

摘要

The arrangement has a probe (1) and a coupling element connected to it for coupling light in or out. The coupling element consists at least in part of a set material and can additionally contain parts of a bearer joined to the probe using setting material. An Independent claim is also included for a method of manufacturing an arrangement for simultaneous force microscopy during optical near field microscopy.