发明名称 |
APPARATUS FOR MEASUREMENT OF CRITICAL CURRENT IN SUPERCONDUCTIVE TAPES |
摘要 |
A cryogenic linear positioner which is primarily used for characterizing coated conductor critical current homogeneity at 75K is disclosed. Additionally, this tool can be used to measure the positional dependence of the coated conductor resistance at room temperature, and the room temperature resistance of the underlying YBCO coating without the overlaying protective cover of silver.
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申请公布号 |
WO0104646(A1) |
申请公布日期 |
2001.01.18 |
申请号 |
WO2000US19234 |
申请日期 |
2000.07.13 |
申请人 |
LOS ALAMOS NATIONAL LABORATORY |
发明人 |
COULTER, J., YATES;DEPAULA, RAYMOND |
分类号 |
G01R33/12;(IPC1-7):G01R19/00 |
主分类号 |
G01R33/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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