| 摘要 |
Improved test heads, probe assemblies, circuit testers, and probe card assemblies are provided for testing electrical circuits, such as, e.g., IC-chips and circuit boards. These apparatus include a plurality of electrically conductive rigid pins (110), which are made of a suitable material, such as, e.g., tungsten. Each of the rigid pins (110) has a pin shaft (112) and a pin contact tip (114). The pin contact tips (114) are configured in a pin pattern corresponding to the terminal pattern, i.e., the pattern in which the terminal (202) of the circuit to be tested are arranged. These apparatus further include a registration medium (118), which encapsulates at least a portion of each of the pin shafts (112). The registration medium (118) provides an efficient means of affixing the rigid pins (110) with respect to each other. The registration medium (118) comprises a compliant material, such as, e.g., silicone, such that the pin contact tips (114) can be placed into firm and simultaneous contact with the circuit terminals (202). In effect, the compliant registration medium (118) allows the pin contact tips (114) to individually self-adjust and compensate for any vertical misregistration between the pin contact tips (114) and the respective circuit terminals (202).
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