| 摘要 |
<p>An electronic device (100) includes a conversion unit (102) provided with a ΔΣ modulator (106) which functions as a D/A converter. The electronic device (100) receives a command signal (40) that indicates a request for a shift to test mode. An electronic device tester (10) includes a pattern generator (16) for generating a pattern to test an analog unit (108) of the electronic device (100). Since the pattern thus generated is a digital signal, it is converted to an analog signal by the ΔΣ modulator (106) before used for a test.</p> |
