Ophthalmological investigation system has second parking position, associated examination position for further examination point for examination, subjective refractive measurement devices

摘要

The arrangement has a base (20) on which an examination table (21) for at least one examination device (24,25) can be adjusted laterally from a parking position (36) into an examination position in front of an examination point and on which are devices that can be directed towards the examination point for subjective refraction measurements. A second parking position and an associated second examination position for a further examination point are provided for the examination device(s) and the device(s) for subjective refractive measurements.