发明名称 Process for building borderless bitline, wordline and DRAM structure and resulting structure
摘要 It is a feature of the present invention that a subminimum dimension wordline links approximately minimum dimensional individual gate segments with the bitline contact being borderless to the worldline. It is still a further object of the present invention to provide a transistor with an individual segment gate conductor and a subminimum dimension gate connector with the bitline contact being borderless to the wordline. A semiconductor structure and method of making same comprising a DRAM cell which has a transistor which includes a gate. The gate comprises an individual segment of gate conductor such as polysilicon on a thin dielectric material. The transistor further comprises a single crystal semiconductor substrate having a source/drain region. An active conductive wordline is deposited on top of and electrically contacting the segment gate conductor with the wordline being a conductive material. Insulating material completely surrounds the active wordline except where the active wordline contacts the segment gate conductor. A bitline contact contacting the insulating material surrounds the wordline contact in the source/drain region to thereby make the bitline contact borderless to the wordline.
申请公布号 US6175128(B1) 申请公布日期 2001.01.16
申请号 US19980052538 申请日期 1998.03.31
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HAKEY MARK C.;HORAK DAVID V.;MA WILLIAM H.;NOBLE, JR. WENDELL P.
分类号 H01L21/60;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L21/60
代理机构 代理人
主权项
地址
您可能感兴趣的专利