发明名称 Semiconductor device and method for fabricating the same
摘要 A semiconductor device includes: a capacitor provided on a supporting substrate having an integrated circuit thereon and including a lower electrode, a dielectric film, and an upper electrode; a first interlayer insulating film provided so as to cover the capacitor; a first interconnect selectively provided on the first interlayer insulating film and electrically connected to the integrated circuit and the capacitor through a first contact hole formed in the first interlayer insulating film; a second interlayer insulating film formed of ozone TEOS and provided so as to cover the first interconnect; a second interconnect selectively provided on the second interlayer insulating film and electrically connected to the first interconnect through a second contact hole formed in the second interlayer insulating film; and a passivation layer provided so as to cover the second interconnect.
申请公布号 US6174822(B1) 申请公布日期 2001.01.16
申请号 US19980175250 申请日期 1998.10.20
申请人 MATSUSHITA ELECTRONICS CORPORATION 发明人 NAGANO YOSHIHISA;KUTSUNAI TOSHIE;JUDAI YUJI;UEMOTO YASUHIRO;FUJII EIJI
分类号 H01L21/02;H01L21/768;H01L21/8242;H01L23/522;(IPC1-7):H01L21/31 主分类号 H01L21/02
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