发明名称 |
Method and apparatus for measuring material properties using transient-grating spectroscopy |
摘要 |
The invention provides an apparatus for measuring a property of a sample (using, e.g., ISTS) that includes: 1) an excitation laser that generates an excitation laser beam; 2) an optical system aligned along an optical axis that separates the excitation laser beam into at least three sub-beams; 3) an imaging system aligned along the optical axis that collects the sub-beams and focuses them onto the sample to form an optical interference pattern that generates a time-dependent response in the sample; 4) a probe laser that generates a probe laser beam that diffracts off the time-dependent response to form a signal beam; 5) a detector that detects the signal beam and in response generates a radiation-induced electronic response; and 6) a processor that processes the radiation-induced electronic response to determine the property of the sample.
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申请公布号 |
US6175421(B1) |
申请公布日期 |
2001.01.16 |
申请号 |
US19990318323 |
申请日期 |
1999.05.25 |
申请人 |
ACTIVE IMPULSE SYSTEMS |
发明人 |
FUCHS MARTIN;ROGERS JOHN A.;BANET MATTHEW J. |
分类号 |
G01B11/06;G01B21/08;G01N21/00;G01N21/17;G01N21/41;G01N21/47;G01N21/63;(IPC1-7):G01B11/02 |
主分类号 |
G01B11/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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