Fast finding algorithm for two-dimensional symbologies

摘要

A plurality of scan lines is used to detect characteristic features of a checkerboard structure or similar pattern structure of symbology within a field of view. The scan lines cross leading edges of the symbology which provides signals to a plurality of processors. The processors detect instances wherein sequential leading edges exhibit angular shifts corresponding to a pattern of the symbology. A further processor is used to detect when a coincidence of these angular shifts occur, thereby providing an indication of the location of the symbology within the field of view.