发明名称 Measuring instrument, probe for the same, and measuring method
摘要 A body 1 placed thereon with a table 35 put thereon with an object to be measured W, and a portal frame 41 supporting both ends of rail 43 to the body through pillars 42A and 42B, the rail being placed above the table 35 and extending along a moving direction of a pair of probes 91A and 91B, are provided. A pair of sliders 51A and 51B are movably supported by the rail 43. The pair of the probes is extended downward from the sliders 51A and 51B to be abutted to the object W put on the table 35. The flexural deformation of the probes 91A and 91B is decreased due to the shorter length of the probes 91A and 91B, so that the high accurate measurement is achieved and a relative measurement is omitted.
申请公布号 US6173504(B1) 申请公布日期 2001.01.16
申请号 US20000477946 申请日期 2000.01.05
申请人 MITUTOYO CORPORATION 发明人 OHTSUKA YUKIHARU;SARUKI YOSHIO;MORIYA YOSHIO
分类号 G01B5/016;G01B5/08;G01B5/12;G01B5/14;(IPC1-7):G01B5/03 主分类号 G01B5/016
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