摘要 |
PURPOSE: A round type elastic wire probe and a probe connection structure of a PCB block are provided to quickly and accurately transmit signals and to prevent deformation by automatically and elastically regulating a length of the probe upon contact of wafer. CONSTITUTION: A round type elastic wire probe comprises a round portion(3) for dispersing elastic force, a right-angled portion(4) for determining an exact position and transferring press pressure upstream. Between the round portion and the right-angled portion are positioned a wire slant portion(2) extending between major axes and a normal wire portion(6) extending downstream the right-angled portion. On opposite ends of the normal wire portion and the round portion, a block ground portion(5), a probe head(8) contacting a wafer and a probe plate(7) are formed.
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