发明名称 |
METHOD FOR MANUFACTURING A POLYSILICON LAYER OF A SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a polysilicon layer of a semiconductor device is to provide a uniform boron density over and under the polysilicon layer, by doping boron ions while forming an amorphous silicon layer, so that boron ions doped by an in-situ method and ion-injected boron ions are combined under the polysilicon layer. CONSTITUTION: A gate insulating layer(3) is evaporated on a semiconductor substrate(1). An impurity doped amorphous silicon layer is formed on the gate insulating layer by an in-situ method. Impurity ions are injected into the amorphous silicon layer. All of the semiconductor substrate are thermally processed so that the impurities doped by an in-situ method and ion-injected impurities are combined under a polysilicon layer(4a).
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申请公布号 |
KR20010002839(A) |
申请公布日期 |
2001.01.15 |
申请号 |
KR19990022860 |
申请日期 |
1999.06.18 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JU, MUN SIK;KIM, HYEON SU;LEE, CHAN HO |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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地址 |
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