发明名称 METHOD FOR MANUFACTURING A POLYSILICON LAYER OF A SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a polysilicon layer of a semiconductor device is to provide a uniform boron density over and under the polysilicon layer, by doping boron ions while forming an amorphous silicon layer, so that boron ions doped by an in-situ method and ion-injected boron ions are combined under the polysilicon layer. CONSTITUTION: A gate insulating layer(3) is evaporated on a semiconductor substrate(1). An impurity doped amorphous silicon layer is formed on the gate insulating layer by an in-situ method. Impurity ions are injected into the amorphous silicon layer. All of the semiconductor substrate are thermally processed so that the impurities doped by an in-situ method and ion-injected impurities are combined under a polysilicon layer(4a).
申请公布号 KR20010002839(A) 申请公布日期 2001.01.15
申请号 KR19990022860 申请日期 1999.06.18
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JU, MUN SIK;KIM, HYEON SU;LEE, CHAN HO
分类号 H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/78
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