发明名称 |
METHOD FOR FORMING DAMASCENE STRUCTURE FORMING METAL WIRING OF SEMICONDUCTOR DEVICE USING CHEMICAL SWELLING PROCESS |
摘要 |
PURPOSE: A method for forming a damascene structure forming a metal wiring of a semiconductor device using a chemical swelling process is provided to form simultaneously a metal contact and a metal wiring by using a chemical swelling process. CONSTITUTION: An insulating layer is formed on a semiconductor substrate. A photoresist containing H+ and a photoresist without H+ are applied sequentially on the insulating layer. A mask process is performed by using a metal contact hole and a reticle for forming a metal line pattern. A photoresist pattern is formed by exposing and developing selectively the photoresist layers. An SC-1 is coated on the insulating layer formed with the photoresist layers. The SC-1 is combined with the photoresist layer containing H+ CSP by performing a chemical swelling process. A pattern is formed by the combination process. A metal contact hole is formed by performing a dry etching process. The remaining photoresist is removed. A metal is deposited on the whole surface of the substrate to bury the metal contact hole. A metal wiring is formed by performing a chemical mechanical polishing process.
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申请公布号 |
KR20010005190(A) |
申请公布日期 |
2001.01.15 |
申请号 |
KR19990025991 |
申请日期 |
1999.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, SANG TAE;JANG, HWAN SU |
分类号 |
H01L21/3205;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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