发明名称 |
METHOD FOR MANUFACTURING PLUG OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a plug of a semiconductor device is provided to guarantee process margin and to reduce manufacturing steps, by controlling a gap between gate lines to form a plug electrically connecting a bit line or a storage node with an active region of a transistor, and by forming a self-aligned plug only in the active region using a sidewall spacer of a gate. CONSTITUTION: A gate insulating layer(32) is formed on a semiconductor substrate(30) in which a field region and an active region are defined. A plurality of gate lines(33) having a cap insulating layer are formed. A low density impurity diffusion region(35) is formed on the active region. A sidewall spacer(361) exposing a part of the low density impurity diffusion region to a side of a gate line of the active region is formed with an insulating material, and the insulating material is filled between gate lines of the field region. A high density impurity diffusion region is formed in the active region by using the sidewall spacer. A conductive plug is formed which contacts the exposed impurity diffusion region and fills a space formed by the sidewall spacer of the active region.
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申请公布号 |
KR20010003285(A) |
申请公布日期 |
2001.01.15 |
申请号 |
KR19990023526 |
申请日期 |
1999.06.22 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, HONG SEON;NAM, SANG HYEOK |
分类号 |
H01L21/283;(IPC1-7):H01L21/283 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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