发明名称 METHOD FOR FORMING METAL WIRING IN SEMICONDUCTOR DEVICES
摘要 PURPOSE: A metal wiring formation method is provided to be capable of simplifying the process by omitting a barrier metal process and of minimizing the contact leakage current while lowering the contact resistance. CONSTITUTION: A metal wiring formation method includes forming a metal contact(3a) and a metal trench(3b) by dual damascene pattern(3). The metal contact is then buried with C-54 TiSi2 using TiCl4 and SiH2. After burying the trench by depositing Al, chemical mechanical polish process is performed.
申请公布号 KR20010004743(A) 申请公布日期 2001.01.15
申请号 KR19990025457 申请日期 1999.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, CHEOL MO
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址