| 摘要 |
PROBLEM TO BE SOLVED: To provide a handling device having the function of detecting leads and its lead detecting method, capable of detecting leads of a tested IC to prevent deformation of the leads due to their positional slippage and to prevent contacts from getting out of position in testing the electrical characteristics of the tested IC, by minimally increasing the size of the device. SOLUTION: This handling device is equipped with a lead detecting means on its measurement part for detecting leads 13 of a semiconductor device 11. The lead detecting means comprises fiber optics 4 for obtaining images of the leads 13 of the semiconductor device 11, cameras 5 for taking in the images obtained of the leads, an image recognition part 6 for recognizing the images taken-in of the leads, and displays 7 for displaying the images obtained. The lead detecting means detects that the leads 13 of the semiconductor device 11 are out of position and displays impressions 14 formed in the leads 13 of the semiconductor device 11 by contact pins 2 of an IC socket 1.
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